Citation: Kaplan, L.; Leitus, G.; Lyakhovitskaya, V.; Frolow, F.; Hallak, H.; Kvick, A.; Cahen, D. (2000). Synchrotron X-ray diffraction evidence for native defects in the photovoltaic semiconductor Cu In Se2. Advanced Materials, 12, pp. 366-370.
Formula: Cu0.974 In Se1.989
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Cu4 In4 Se8 (Cu In Se2)
Multiplicity: 1
RCSR Symbol: dia
Coordination sequences: