Citation: Kim, Y.-I.; Jung, M.-J.; Kim, K.H. (2000). Application of inverse pole figure to Rietveld refinement: III. Rietveld refinement of Sn O2 thin film using X-ray diffraction data. The Korean Journal of Ceramics, 6, pp. 354-358.
Formula: O2 Sn
Chemical name: Sn O2
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: O4 Sn2 (O2 Sn)
Multiplicity: 1
Coordination sequences: