Citation: Tanaka, K.; Nawata, K.; Koiwa, M.; Inui, H.; Yamaguchi, M. (2001). Refinement of crystallographic parameters in refractory metal disilicides. Materials Research Society Symposia Proceedings, 646, pp. N4.3.1-N4.3.5.
Formula: Si2 Ta
Chemical name: Ta Si2
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Si6 Ta3 (Si2 Ta)
Multiplicity: 1
Coordination sequences: