Citation: Agaev, K.A.; Gasymov, V.A.; Chiragov, M.I. (1973). Electron-diffraction investigation of the structure of thin Tl In S2 films. Soviet Physics, Crystallography (= Kristallografiya), 18, pp. 226-227.
Formula: In S2 Tl
Chemical name: In Tl S2
List type: interleaving
List: 2D
Basis: (1;0;0 0;1;0)
Dimensionality: 2
Formula: In S2 (In S2)
Multiplicity: 1
RCSR Symbol: kgd
Coordination sequences: