Structure 2003111

2003106 << 2003111 >> 2003116
Original COD entry Download CIF Download DOT

Citation: Ivanov, Yu.V.; Belokoneva, E.L.; Protas, J.; Hansen, N.K.; Tsirelson, V.G. (1998). Multipole Analysis of the Electron Density in Topaz Using X-ray Diffraction Data. Acta Crystallographica Section B, 54, pp. 774-781.

Formula: Al2 F2 O4 Si

Cell parameters:

  • a = 4.6511(8) Å
  • b = 8.8020(10) Å
  • c = 8.4020(10) Å
  • α = 90.0°
  • β = 90.0°
  • γ = 90.0°

List type: noninterleaving

List: 3D

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Molecules

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