Citation: Morell, H.; Angermund, K.; Fyfe, C.A.; Lewis, A.R.; Brouwer, D.H.; Gies, H. (2002). Structural investigation of silicalite-I loaded with n-hexane by X-ray diffraction, (29)Si MAS NMR and molecular modeling. Chemistry of Materials (1,1989-), 14, pp. 2192-2198.