Citation: Takahashi, J.; Kamiyama, T.; Yamane, H.; Hirosaki, N.; Yamamoto, Y.; Suehiro, T.; Shimada, M. (2003). Crystal structure of La4 Si2 O7 N2 analyzed by the Rietveld method using the time-of-flight neutron powder diffraction data. Chemistry of Materials (1,1989-), 15, pp. 1099-1104.
Formula: La4 N2 O7 Si2
Chemical name: La4 (Si2 O7 N2)
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: La16 N32 O36 Si8 (La4 N8 O9 Si2)
Multiplicity: 1