Citation: Fils\/o, M \/O; Eikeland, E.; Zhang, J.; Madsen, S. R.; Iversen, B. B. (2016). Atomic and electronic structure transformations in SnS2 at high pressures: a joint single crystal X-ray diffraction and DFT study.. Dalton transactions (Cambridge, England : 2003), 45, pp. 3798-3805.