Citation: Senda, K.; Ishida, K.; Jenkins, D. M. (2005). X-ray Rietveld refinement and FTIR spectra of synthetic (Si,Ge)-richterites Sample: KGe0Ri, K in A site, Si100Ge0. American Mineralogist, 90, pp. 1062-1071.
Formula: Ca1.02 H2 K0.954 Mg5 Na0.98 O24 Si8
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Mg10 O48 Si16 (Mg5 O24 Si8)
Multiplicity: 1