Citation: Senda, K.; Ishida, K.; Jenkins, D. M. (2005). X-ray Rietveld refinement and FTIR spectra of synthetic (Si,Ge)-richterites Sample: Ge2Ri, Si74Ge26. American Mineralogist, 90, pp. 1062-1071.
Formula: Ca0.9 Ge2.04 H2 Mg5 Na1.54 O24 Si5.96
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Ge16 Mg10 O48 Si16 (Ge8 Mg5 O24 Si8)
Multiplicity: 1