Citation: Chen, J.; Lager, G. A.; Kunz, M.; Hansen, T. C.; Ulmer, P. (2005). A Rietveld refinement using neutron powder diffraction data of a fully deuterated topaz, Al2SiO4(OD)2. Acta Crystallographica, Section E, 61, pp. i253-i255.
Formula: Al2 D2 O6 Si
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Al8 D16 O24 Si4 (Al2 D4 O6 Si)
Multiplicity: 1