Structure 9009239

9009238 << 9009239 >> 9009240
Original COD entry Download CIF Download DOT

Citation: Trahan, J.; Goodrich, R. G.; Watkins, S. F. (1970). X-ray diffraction measurements on metallic and semiconducting hexagonal NiS Note: T = 77 K. Physical Review B, 2, pp. 2859-2863.

Formula: Ni S

Cell parameters:

  • a = 3.4456 Å
  • b = 3.4456 Å
  • c = 5.405 Å
  • α = 90°
  • β = 90°
  • γ = 120°

List type: noninterleaving

List: 3D

Combined 3D structure and graph

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JSmol combined CIF view

Linear Graph Knot

Molecules

CIF datablock 0, entity 1 of 1

Basis: (1;0;0 0;1;0 0;0;1)

Dimensionality: 3

Formula: Ni2 S2 (Ni S)

Multiplicity: 1

RCSR Symbol: seh

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