Citation: Trahan, J.; Goodrich, R. G.; Watkins, S. F. (1970). X-ray diffraction measurements on metallic and semiconducting hexagonal NiS Note: T = 77 K. Physical Review B, 2, pp. 2859-2863.
Formula: Ni S
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Ni2 S2 (Ni S)
Multiplicity: 1
RCSR Symbol: seh
Coordination sequences: