Citation: Gualtieri, A. F. (2000). Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Vallerano, Rome, Italy. Journal of Applied Crystallography, 33, pp. 267-278.
Formula: Al3.2 Ca0.78 H7.5 K1.22 Na0.41 O21.13 Si4.8
List type: interleaving
List: 1-3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Al16 O32 Si16 (Al O2 Si)
Multiplicity: 1
Basis: (0;1;0)
Dimensionality: 1
Formula: Ca4 K4 O8 (Ca K O2)