Citation: Gualtieri, A. F. (2000). Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Latera, Viterbo, Italy. Journal of Applied Crystallography, 33, pp. 267-278.
Formula: Al K O8 Si3
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Al16 O32 Si16 (Al O2 Si)
Multiplicity: 1
Coordination sequences: