Citation: Gualtieri, A. F. (2000). Accuracy of XRPD QPA using the combined Rietveld-RIR method. Journal of Applied Crystallography, 33, pp. 267-278.
Formula: Al4 K O12 Si2
List type: interleaving
List: 2D
Basis: (1;0;0 0;1;0)
Dimensionality: 2
Formula: Al8 O24 Si4 (Al2 O6 Si)
Multiplicity: 1