Citation: Gualtieri, A. F. (2000). Accuracy of XRPD QPA using the combined Rietveld-RIR method. Journal of Applied Crystallography, 33, pp. 267-278.
Formula: O2 Si
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: O6 Si3 (O2 Si)
Multiplicity: 1
Coordination sequences: