Citation: Hom, T.; Kiszenick, W.; Post, B. (1975). Accurate lattice constants from multiple reflection mesurements II. lattice constants of germanium, silicon and diamond Sample: at T = 25 C. Journal of Applied Crystallography, 8, pp. 457-458.
Formula: Si
List type: noninterleaving
List: 3D
Basis: (1;0;0 0;1;0 0;0;1)
Dimensionality: 3
Formula: Si8 (Si)
Multiplicity: 1
RCSR Symbol: dia
Coordination sequences: